Prediction of Board Level Pad Cratering Strength with the Pre-Defined Failure Criteria From Joint Level Testing

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Packaging Pub Date : 2021-12-20 DOI:10.1115/1.4053309
Qiming Zhang, S. Lee
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Abstract

Conventional reliability tests for the evaluation of pad cratering resistance are mainly classified into two categories: the board level test and the joint level test. The board level test is to imitate the loading conditions during normal operation. However, this type of test is expensive and not flexible. The joint level test is used extensively in the industry because it has the advantages of lower cost, higher throughput, and more quantitative results. It also allows the elimination of confounding factors such as PCB and component stiffness. Therefore, it is always desirable to predict the board level performance by a joint level test. In order to achieve this objective, the correlation between the joint level and the board level tests must be fully understood. Nevertheless, a precise correlation between the two types of tests for pad cratering evaluation is yet to be defined. This study investigates the pad cratering failure mode for the correlation of critical failure factors between joint and board level tests. An intermediate critical failure factor could be taken as a failure criterion in board level testing for failure detection. For verifying the validity of such a failure criterion, an experimental study should be performed. The 4-point bending test is chosen as the board level test for critical failure factor validation. In addition, an innovative pin shear test method is developed as the joint level test for failure factor detection. Both test methods are assessed by a series of parametric studies with an optimized process to ensure the accuracy of the results. From the results of the experimental study and simulation, the critical failure factor correlation is established between the board level 4-point bending and the joint level pin shear test. Using finite element analysis (FEA), the critical failure strain is identified from the pin shear test model and will be employed as the board level failure criterion. Subsequently the obtained failure criterion is verified by a 4-point bending model. As a result, this indirect correlation method can predict the board level failure with various geometric parameters.
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用联合水平测试中预先定义的失效准则预测板级衬垫板条箱强度
传统的垫块抗弹坑可靠性评估试验主要分为两类:垫块水平试验和联合水平试验。板面水平试验是模拟正常运行时的加载情况。然而,这种测试既昂贵又不灵活。联合水平试验具有成本低、通量高、定量结果多等优点,在工业中得到广泛应用。它还允许消除混淆因素,如PCB和组件刚度。因此,通过联合水平测试来预测董事会水平的表现总是可取的。为了实现这一目标,必须充分了解联合水平和董事会水平测试之间的相关性。然而,两种类型的垫坑评估试验之间的精确相关性还有待确定。本研究针对接缝与板级试验中临界破坏因子的相关性,探讨了垫坑破坏模式。在板级测试中,可以将中间临界失效因子作为故障判据,进行故障检测。为了验证这种失效准则的有效性,需要进行实验研究。关键失效因素验证的板级试验选择4点弯曲试验。此外,提出了一种新颖的销剪试验方法,作为检测破坏因素的接头水平试验方法。两种测试方法都通过一系列参数研究和优化过程进行评估,以确保结果的准确性。从试验研究和仿真结果出发,建立了板级4点弯曲与节理级销剪试验的临界破坏因子相关性。采用有限元分析方法,从销剪试验模型中确定临界破坏应变,并将其作为板级破坏准则。然后用四点弯曲模型验证了所得的破坏准则。结果表明,这种间接相关方法可以预测不同几何参数下的板级失效。
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来源期刊
Journal of Electronic Packaging
Journal of Electronic Packaging 工程技术-工程:电子与电气
CiteScore
4.90
自引率
6.20%
发文量
44
审稿时长
3 months
期刊介绍: The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems. Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.
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