Physically motivated global alignment method for electron tomography

Toby Sanders, Micah Prange, Cem Akatay, Peter Binev
{"title":"Physically motivated global alignment method for electron tomography","authors":"Toby Sanders,&nbsp;Micah Prange,&nbsp;Cem Akatay,&nbsp;Peter Binev","doi":"10.1186/s40679-015-0005-7","DOIUrl":null,"url":null,"abstract":"<p>Electron tomography is widely used for nanoscale determination of 3-D structures in many areas of science. Determining the 3-D structure of a sample from electron tomography involves three major steps: acquisition of sequence of 2-D projection images of the sample with the electron microscope, alignment of the images to a common coordinate system, and 3-D reconstruction and segmentation of the sample from the aligned image data. The resolution of the 3-D reconstruction is directly influenced by the accuracy of the alignment, and therefore, it is crucial to have a robust and dependable alignment method. In this paper, we develop a new alignment method which avoids the use of markers and instead traces the computed paths of many identifiable ‘local’ center-of-mass points as the sample is rotated. Compared with traditional correlation schemes, the alignment method presented here is resistant to cumulative error observed from correlation techniques, has very rigorous mathematical justification, and is very robust since many points and paths are used, all of which inevitably improves the quality of the reconstruction and confidence in the scientific results.</p>","PeriodicalId":460,"journal":{"name":"Advanced Structural and Chemical Imaging","volume":"1 1","pages":""},"PeriodicalIF":3.5600,"publicationDate":"2015-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s40679-015-0005-7","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Structural and Chemical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s40679-015-0005-7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Medicine","Score":null,"Total":0}
引用次数: 22

Abstract

Electron tomography is widely used for nanoscale determination of 3-D structures in many areas of science. Determining the 3-D structure of a sample from electron tomography involves three major steps: acquisition of sequence of 2-D projection images of the sample with the electron microscope, alignment of the images to a common coordinate system, and 3-D reconstruction and segmentation of the sample from the aligned image data. The resolution of the 3-D reconstruction is directly influenced by the accuracy of the alignment, and therefore, it is crucial to have a robust and dependable alignment method. In this paper, we develop a new alignment method which avoids the use of markers and instead traces the computed paths of many identifiable ‘local’ center-of-mass points as the sample is rotated. Compared with traditional correlation schemes, the alignment method presented here is resistant to cumulative error observed from correlation techniques, has very rigorous mathematical justification, and is very robust since many points and paths are used, all of which inevitably improves the quality of the reconstruction and confidence in the scientific results.

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电子断层扫描的物理驱动全局对准方法
电子断层扫描在许多科学领域被广泛用于纳米尺度的三维结构测定。从电子断层扫描中确定样品的三维结构包括三个主要步骤:用电子显微镜获取样品的二维投影图像序列,将图像对齐到一个共同的坐标系,以及从对齐的图像数据中对样品进行三维重建和分割。对准精度直接影响到三维重建的分辨率,因此,一种鲁棒可靠的对准方法至关重要。在本文中,我们开发了一种新的对齐方法,该方法避免了使用标记,而是在样本旋转时跟踪许多可识别的“局部”质心点的计算路径。与传统的相关方法相比,本文提出的对准方法能够抵抗相关技术观测到的累积误差,具有非常严格的数学证明,并且由于使用了许多点和路径,因此具有很强的鲁棒性,这些都不可避免地提高了重建的质量和对科学结果的信心。
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Advanced Structural and Chemical Imaging
Advanced Structural and Chemical Imaging Medicine-Radiology, Nuclear Medicine and Imaging
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