{"title":"Dynamic Loss For Robust Learning","authors":"Shenwang Jiang, Jianan Li, Jizhou Zhang, Ying Wang, Tingfa Xu","doi":"10.48550/arXiv.2211.12506","DOIUrl":null,"url":null,"abstract":"Label noise and class imbalance are common challenges encountered in real-world datasets. Existing approaches for robust learning often focus on addressing either label noise or class imbalance individually, resulting in suboptimal performance when both biases are present. To bridge this gap, this work introduces a novel meta-learning-based dynamic loss that adapts the objective functions during the training process to effectively learn a classifier from long-tailed noisy data. Specifically, our dynamic loss consists of two components: a label corrector and a margin generator. The label corrector is responsible for correcting noisy labels, while the margin generator generates per-class classification margins by capturing the underlying data distribution and the learning state of the classifier. In addition, we employ a hierarchical sampling strategy that enriches a small amount of unbiased metadata with diverse and challenging samples. This enables the joint optimization of the two components in the dynamic loss through meta-learning, allowing the classifier to effectively adapt to clean and balanced test data. Extensive experiments conducted on multiple real-world and synthetic datasets with various types of data biases, including CIFAR-10/100, Animal-10N, ImageNet-LT, and Webvision, demonstrate that our method achieves state-of-the-art accuracy. The code for our approach will soon be made publicly available.","PeriodicalId":13426,"journal":{"name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","volume":" ","pages":""},"PeriodicalIF":20.8000,"publicationDate":"2022-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Pattern Analysis and Machine Intelligence","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.48550/arXiv.2211.12506","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Label noise and class imbalance are common challenges encountered in real-world datasets. Existing approaches for robust learning often focus on addressing either label noise or class imbalance individually, resulting in suboptimal performance when both biases are present. To bridge this gap, this work introduces a novel meta-learning-based dynamic loss that adapts the objective functions during the training process to effectively learn a classifier from long-tailed noisy data. Specifically, our dynamic loss consists of two components: a label corrector and a margin generator. The label corrector is responsible for correcting noisy labels, while the margin generator generates per-class classification margins by capturing the underlying data distribution and the learning state of the classifier. In addition, we employ a hierarchical sampling strategy that enriches a small amount of unbiased metadata with diverse and challenging samples. This enables the joint optimization of the two components in the dynamic loss through meta-learning, allowing the classifier to effectively adapt to clean and balanced test data. Extensive experiments conducted on multiple real-world and synthetic datasets with various types of data biases, including CIFAR-10/100, Animal-10N, ImageNet-LT, and Webvision, demonstrate that our method achieves state-of-the-art accuracy. The code for our approach will soon be made publicly available.
期刊介绍:
The IEEE Transactions on Pattern Analysis and Machine Intelligence publishes articles on all traditional areas of computer vision and image understanding, all traditional areas of pattern analysis and recognition, and selected areas of machine intelligence, with a particular emphasis on machine learning for pattern analysis. Areas such as techniques for visual search, document and handwriting analysis, medical image analysis, video and image sequence analysis, content-based retrieval of image and video, face and gesture recognition and relevant specialized hardware and/or software architectures are also covered.