I. N. Nasyrov, I. I. Nasyrov, R. I. Nasyrov, B. A. Khairullin
{"title":"Method for Hdd Reliability Multiparametric Assessment","authors":"I. N. Nasyrov, I. I. Nasyrov, R. I. Nasyrov, B. A. Khairullin","doi":"10.36097/RSAN.V1I44.1607.G933","DOIUrl":null,"url":null,"abstract":"A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.","PeriodicalId":43518,"journal":{"name":"Revista San Gregorio","volume":null,"pages":null},"PeriodicalIF":0.2000,"publicationDate":"2021-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Revista San Gregorio","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.36097/RSAN.V1I44.1607.G933","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"SOCIAL SCIENCES, INTERDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.
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