He Zheng, Fan Cao, Ligong Zhao, Renhui Jiang, Peili Zhao, Ying Zhang, Yanjie Wei, S. Meng, Kaixuan Li, Shuangfeng Jia, Luying Li, Jianbo Wang
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引用次数: 2
Abstract
In situ transmission electron microscopy has achieved remarkable advances for atomic-scale dynamic analysis in low-dimensional materials and become an indispensable tool in view of linking a material's microstructure to its properties and performance. Here, accompanied with some cutting-edge researches worldwide, we briefly review our recent progress in dynamic atomistic characterization of low-dimensional materials under external mechanical stress, thermal excitations and electrical field. The electron beam irradiation effects in metals and metal oxides are also discussed. We conclude by discussing the likely future developments in this area.
期刊介绍:
Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.