PM-16 Fast Scanning Method Applicable as a Standard Acquisition Mode for SEM

IF 1.5 4区工程技术 Q3 MICROSCOPY Microscopy Pub Date : 2019-11-01 DOI:10.1093/jmicro/dfz095

E. Oho, Kazuhiko Suzuki, Sadao Yamazaki

引用次数: 0

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

适用于SEM标准采集模式的PM-16快速扫描方法

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文去求助

来源期刊

Microscopy Physics and Astronomy-Instrumentation

CiteScore

3.30

自引率

11.10%

发文量

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.

期刊最新文献

In This Issue Real-time scanning electron microscopy of unfixed tissue in the solution using a deformable and electron-transmissive film Atomic-Resolution STEM Image Denoising by Total Variation Regularization. Super-Resolution Reconstruction Based on BM3D and Compressed Sensing. Reliable Electrochemical Setup for in situ Observations with an Atmospheric SEM.