Aberration control in quantitative widefield quantum microscopy

IF 4.2 Q2 QUANTUM SCIENCE & TECHNOLOGY AVS quantum science Pub Date : 2022-07-26 DOI:10.1116/5.0114436
S. C. Scholten, I. O. Robertson, G. Abrahams, Priya Singh, A. J. Healey, J. Tetienne
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Abstract

Widefield quantum microscopy based on nitrogen-vacancy (NV) centers in diamond has emerged as a powerful technique for quantitative mapping of magnetic fields with a sub-micrometer resolution. However, the accuracy of the technique has not been characterized in detail so far. Here, we show that optical aberrations in the imaging system may cause large systematic errors in the measured quantity beyond trivial blurring. We introduce a simple theoretical framework to model these effects, which extends the concept of a point spread function to the domain of spectral imaging. Using this model, the magnetic field imaging of test magnetic samples is simulated under various scenarios, and the resulting errors are quantified. We then apply the model to previously published data, show that apparent magnetic anomalies can be explained by the presence of optical aberrations, and demonstrate a post-processing technique to retrieve the source quantity with improved accuracy. This work presents a guide to predict and mitigate aberration induced artifacts in quantitative NV-based widefield imaging and in spectral imaging more generally.
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定量宽场量子显微镜中的像差控制
基于金刚石中氮空位(NV)中心的宽视场量子显微镜已经成为一种强大的亚微米分辨率磁场定量制图技术。然而,到目前为止,这项技术的准确性还没有得到详细的描述。在这里,我们表明,光学像差在成像系统可能会导致大的系统误差在测量量超出微不足道的模糊。我们引入了一个简单的理论框架来模拟这些影响,它将点扩展函数的概念扩展到光谱成像领域。利用该模型对测试磁样在各种场景下的磁场成像进行了仿真,并对结果误差进行了量化。然后,我们将该模型应用于先前发表的数据,表明表观磁异常可以通过光学像差的存在来解释,并演示了一种后处理技术,以提高精度检索源量。这项工作提出了一个指南,以预测和减轻定量的基于nv的宽视场成像和更普遍的光谱成像像差引起的伪影。
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