Shear Strength Degradation Modeling of Lead-Free Solder Joints at Different Isothermal Aging Conditions

Dania Bani Hani, R. Athamneh, Mohammed A. Aljarrah, S. Hamasha
{"title":"Shear Strength Degradation Modeling of Lead-Free Solder Joints at Different Isothermal Aging Conditions","authors":"Dania Bani Hani, R. Athamneh, Mohammed A. Aljarrah, S. Hamasha","doi":"10.4071/imaps.1423793","DOIUrl":null,"url":null,"abstract":"\n SAC-based alloys are one of the most common solder materials that are utilized to provide mechanical support and electrical connection between electronic components and the printed circuit board. Enhancing the mechanical properties of solder joints can improve the life of the components. One of the mechanical properties that define the solder joint structure integrity is the shear strength. The main objective of this study is to assess the shear strength behavior of SAC305 solder joints under different aging conditions. Instron 5948 Micromechanical Tester with a customized fixture is used to perform accelerated shear tests on individual solder joints. The shear strength of SAC305 solder joints with organic solderability preservative (OSP) surface finish is investigated at constant strain rate under different aging times (2, 10, 100, and 1,000 h) and different aging temperatures (50, 100, and 150°C). The nonaged solder joints are examined as well for comparison purposes. Analysis of variance (ANOVA) is accomplished to identify the contribution of each parameter on the shear strength. A general empirical model is developed to estimate the shear strength as a function of aging conditions using the Arrhenius term. Microstructure analysis is performed at different aging conditions using scanning electron microscope (SEM). The results revealed a significant reduction in the shear strength when the aging level is increased. An increase in the precipitates coarsening and intermetallic compound (IMC) layer thickness are observed with increased aging time and temperature.","PeriodicalId":35312,"journal":{"name":"Journal of Microelectronics and Electronic Packaging","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Microelectronics and Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4071/imaps.1423793","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 4

Abstract

SAC-based alloys are one of the most common solder materials that are utilized to provide mechanical support and electrical connection between electronic components and the printed circuit board. Enhancing the mechanical properties of solder joints can improve the life of the components. One of the mechanical properties that define the solder joint structure integrity is the shear strength. The main objective of this study is to assess the shear strength behavior of SAC305 solder joints under different aging conditions. Instron 5948 Micromechanical Tester with a customized fixture is used to perform accelerated shear tests on individual solder joints. The shear strength of SAC305 solder joints with organic solderability preservative (OSP) surface finish is investigated at constant strain rate under different aging times (2, 10, 100, and 1,000 h) and different aging temperatures (50, 100, and 150°C). The nonaged solder joints are examined as well for comparison purposes. Analysis of variance (ANOVA) is accomplished to identify the contribution of each parameter on the shear strength. A general empirical model is developed to estimate the shear strength as a function of aging conditions using the Arrhenius term. Microstructure analysis is performed at different aging conditions using scanning electron microscope (SEM). The results revealed a significant reduction in the shear strength when the aging level is increased. An increase in the precipitates coarsening and intermetallic compound (IMC) layer thickness are observed with increased aging time and temperature.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
不同等温时效条件下无铅焊点剪切强度退化模型
SAC基合金是最常见的焊接材料之一,用于在电子元件和印刷电路板之间提供机械支撑和电连接。提高焊点的机械性能可以提高部件的使用寿命。定义焊点结构完整性的机械性能之一是剪切强度。本研究的主要目的是评估SAC305焊点在不同老化条件下的剪切强度行为。Instron 5948微机械测试仪配有定制夹具,用于对单个焊点进行加速剪切测试。研究了具有有机可焊性防腐剂(OSP)表面光洁度的SAC305焊点在不同老化时间(2、10、100和1000小时)和不同老化温度(50、100和150°C)下在恒定应变速率下的剪切强度。为了进行比较,还对未老化的焊点进行了检查。方差分析(ANOVA)用于确定每个参数对剪切强度的贡献。开发了一个通用的经验模型,使用阿伦尼斯项来估计作为老化条件函数的剪切强度。使用扫描电子显微镜(SEM)在不同的老化条件下进行微观结构分析。结果表明,当老化水平增加时,剪切强度显著降低。随着时效时间和温度的增加,观察到析出物粗化和金属间化合物(IMC)层厚度的增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Journal of Microelectronics and Electronic Packaging
Journal of Microelectronics and Electronic Packaging Engineering-Electrical and Electronic Engineering
CiteScore
1.30
自引率
0.00%
发文量
5
期刊介绍: The International Microelectronics And Packaging Society (IMAPS) is the largest society dedicated to the advancement and growth of microelectronics and electronics packaging technologies through professional education. The Society’s portfolio of technologies is disseminated through symposia, conferences, workshops, professional development courses and other efforts. IMAPS currently has more than 4,000 members in the United States and more than 4,000 international members around the world.
期刊最新文献
Study on the Manufacturability of X Dimension Fan Out Integration Package with Organic RDLs (XDFOI-O) AlGaN High Electron Mobility Transistor for High-Temperature Logic A Novel Approach for Characterizing Epoxy Mold Compound High Temperature Swelling Dual-Band Dual-Polarized Antennas for 5G mmWave Base Stations An Evaluation on the Mechanical and Conductive Performance of Electrically Conductive Film Adhesives with Glass Fabric Carriers
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1