Design Optimization By Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies
Ralf Dӧring, R. Dudek, S. Rzepka, L. Scheiter, E. Noack, B. Seiler
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引用次数: 0
Abstract
A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using ‘virtual prototyping’. Here, a virtual flip chip ball grid array (FC-BGA) is examined in compari-son to a reference chip scale package (CSP). The com-parison is performed using finite element (FE) simula-tion. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and opti-cal measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The obtained find-ings can be extrapolated to alternative package types with different but similar design to evaluate their suita-bility for the desired application before physical fabrication.
期刊介绍:
The Journal of Electronic Packaging publishes papers that use experimental and theoretical (analytical and computer-aided) methods, approaches, and techniques to address and solve various mechanical, materials, and reliability problems encountered in the analysis, design, manufacturing, testing, and operation of electronic and photonics components, devices, and systems.
Scope: Microsystems packaging; Systems integration; Flexible electronics; Materials with nano structures and in general small scale systems.