Controlling residual hydrogen gas in mass spectra during pulsed laser atom probe tomography

R. Prakash Kolli
{"title":"Controlling residual hydrogen gas in mass spectra during pulsed laser atom probe tomography","authors":"R. Prakash Kolli","doi":"10.1186/s40679-017-0043-4","DOIUrl":null,"url":null,"abstract":"<p>Residual hydrogen (H<sub>2</sub>) gas in the analysis chamber of an atom probe instrument limits the ability to measure H concentration in metals and alloys. Measuring H concentration would permit quantification of important physical phenomena, such as hydrogen embrittlement, corrosion, hydrogen trapping, and grain boundary segregation. Increased insight into the behavior of residual H<sub>2</sub> gas on the specimen tip surface in atom probe instruments could help reduce these limitations. The influence of user-selected experimental parameters on the field adsorption and desorption of residual H<sub>2</sub> gas on nominally pure copper (Cu) was studied during ultraviolet pulsed laser atom probe tomography. The results indicate that the total residual hydrogen concentration, <i>H</i>\n <sub>TOT</sub>, in the mass spectra exhibits a generally decreasing trend with increasing laser pulse energy and increasing laser pulse frequency. Second-order interaction effects are also important. The pulse energy has the greatest influence on the quantity <i>H</i>\n <sub>TOT</sub>, which is consistently less than 0.1?at.% at a value of 80?pJ.</p>","PeriodicalId":460,"journal":{"name":"Advanced Structural and Chemical Imaging","volume":"3 1","pages":""},"PeriodicalIF":3.5600,"publicationDate":"2017-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1186/s40679-017-0043-4","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Structural and Chemical Imaging","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1186/s40679-017-0043-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Medicine","Score":null,"Total":0}
引用次数: 25

Abstract

Residual hydrogen (H2) gas in the analysis chamber of an atom probe instrument limits the ability to measure H concentration in metals and alloys. Measuring H concentration would permit quantification of important physical phenomena, such as hydrogen embrittlement, corrosion, hydrogen trapping, and grain boundary segregation. Increased insight into the behavior of residual H2 gas on the specimen tip surface in atom probe instruments could help reduce these limitations. The influence of user-selected experimental parameters on the field adsorption and desorption of residual H2 gas on nominally pure copper (Cu) was studied during ultraviolet pulsed laser atom probe tomography. The results indicate that the total residual hydrogen concentration, H TOT, in the mass spectra exhibits a generally decreasing trend with increasing laser pulse energy and increasing laser pulse frequency. Second-order interaction effects are also important. The pulse energy has the greatest influence on the quantity H TOT, which is consistently less than 0.1?at.% at a value of 80?pJ.

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脉冲激光原子探针层析成像质谱中残余氢气的控制
原子探针仪器分析室中残留的氢(H2)气体限制了测量金属和合金中氢浓度的能力。测量氢浓度可以量化重要的物理现象,如氢脆、腐蚀、氢俘获和晶界偏析。在原子探针仪器中增加对样品尖端表面残余H2气体行为的了解可以帮助减少这些限制。采用紫外脉冲激光原子探针层析成像技术,研究了用户选择的实验参数对名义纯铜(Cu)表面残余H2气体现场吸附和解吸的影响。结果表明:随着激光脉冲能量的增加和激光脉冲频率的增加,质谱中总残余氢浓度H TOT总体呈下降趋势;二阶相互作用效应也很重要。脉冲能量对H - TOT量的影响最大,始终小于0.1?at。%,值为80pj。
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Advanced Structural and Chemical Imaging
Advanced Structural and Chemical Imaging Medicine-Radiology, Nuclear Medicine and Imaging
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