{"title":"Challenges in Design, Data Placement, Migration and Power-Performance Trade-offs in DRAM-NVM-based Hybrid Memory Systems","authors":"Sadhana Rai, B. Talawar","doi":"10.1080/02564602.2022.2127945","DOIUrl":null,"url":null,"abstract":"DRAM-NVM-based hybrid memory opens up a varied range of power-performance-area operational configurations through page migration between the high-performance DRAM and the reliable NVM. The amalgamation of two technologies requires various modifications for the existing monolithic DRAM-based systems. This paper summarizes the current research work in the areas of data placement and page migration in hybrid memories. The challenges and design solutions from a range of NVMs-PCM, STT-RAM, ReRAM is presented. This paper also identifies several research challenges in these areas.","PeriodicalId":13252,"journal":{"name":"IETE Technical Review","volume":"40 1","pages":"498 - 520"},"PeriodicalIF":2.5000,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IETE Technical Review","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1080/02564602.2022.2127945","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
DRAM-NVM-based hybrid memory opens up a varied range of power-performance-area operational configurations through page migration between the high-performance DRAM and the reliable NVM. The amalgamation of two technologies requires various modifications for the existing monolithic DRAM-based systems. This paper summarizes the current research work in the areas of data placement and page migration in hybrid memories. The challenges and design solutions from a range of NVMs-PCM, STT-RAM, ReRAM is presented. This paper also identifies several research challenges in these areas.
期刊介绍:
IETE Technical Review is a world leading journal which publishes state-of-the-art review papers and in-depth tutorial papers on current and futuristic technologies in the area of electronics and telecommunications engineering. We also publish original research papers which demonstrate significant advances.