Electron beam induced dehydrogenation of MgH2 studied by VEELS

Alexander Surrey, Ludwig Schultz, Bernd Rellinghaus
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引用次数: 10

Abstract

Nanosized or nanoconfined hydrides are promising materials for solid-state hydrogen storage. Most of these hydrides, however, degrade fast during the structural characterization utilizing transmission electron microscopy (TEM) upon the irradiation with the imaging electron beam due to radiolysis. We use ball-milled MgH2 as a reference material for in-situ TEM experiments under low-dose conditions to study and quantitatively understand the electron beam-induced dehydrogenation. For this, valence electron energy loss spectroscopy (VEELS) measurements are conducted in a monochromated FEI Titan3 80–300 microscope. From observing the plasmonic absorptions it is found that MgH2 successively converts into Mg upon electron irradiation. The temporal evolution of the spectra is analyzed quantitatively to determine the thickness-dependent, characteristic electron doses for electron energies of both 80 and 300 keV. The measured electron doses can be quantitatively explained by the inelastic scattering of the incident high-energy electrons by the MgH2 plasmon. The obtained insights are also relevant for the TEM characterization of other hydrides.

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电子束诱导MgH2脱氢的研究
纳米氢化物是一种很有前途的固态储氢材料。然而,在利用透射电子显微镜(TEM)在成像电子束照射下进行结构表征时,由于辐射分解,大多数这些氢化物降解得很快。我们以球磨MgH2作为参考材料,在低剂量条件下进行原位TEM实验,研究和定量理解电子束诱导脱氢。为此,在单铬化FEI Titan3 80-300显微镜下进行了价电子能损失谱(VEELS)测量。通过对等离子体吸收的观察,发现MgH2在电子辐照下依次转化为Mg。定量分析了光谱的时间演化,以确定电子能量为80和300 keV时的厚度依赖特征电子剂量。测量到的电子剂量可以用MgH2等离子体激元对入射高能电子的非弹性散射来定量解释。所获得的见解也与其他氢化物的TEM表征有关。
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Advanced Structural and Chemical Imaging
Advanced Structural and Chemical Imaging Medicine-Radiology, Nuclear Medicine and Imaging
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