Vertical nanoscale strain-induced electronic localization in epitaxial La2/3Sr1/3MnO3 films with ZrO2 nanopillar inclusions

IF 13.4 2区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY Nano Convergence Pub Date : 2023-07-28 DOI:10.1186/s40580-023-00382-6

Yuze Gao, Manuel A. Roldan, Liang Qiao, David Mandrus, Xuechu Shen, Matthew F. Chisholm, David J. Singh, Guixin Cao

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Abstract

Unusual electrical transport properties associated with weak or strong localization are sometimes found in disordered electronic materials. Here, we report experimental observation of a crossover of electronic behavior from weak localization to enhanced weak localization due to the spatial influence of disorder induced by ZrO₂ nanopillars in (La_2/3Sr_1/3MnO₃)_1−x:(ZrO₂)_x (x = 0, 0.2, and 0.3) nanocomposite films. The spatial strain regions, identified by scanning transmission electron microscopy and high-resolution x-ray diffraction, induce a coexistence of two-dimentional (2D) and three-dimentional (3D) localization and switches to typical 2D localization with increasing density of ZrO₂ pillars due to length scale confinement, which interestingly accords with enhancing vertically interfacial strain. Based on the excellent agreement of our experimental results with one-parameter scaling theory of localization, the enhanced weak localization exists in metal range close to the fixed point. These films provide a tunable experimental model for studying localization in particular the transition regime by appropriate choice of the second epitaxial phase.

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ZrO2纳米柱状外延La2/3Sr1/3MnO3薄膜的垂直纳米应变诱导电子局部化

在无序电子材料中有时会发现与弱或强局域化有关的不寻常的电输运性质。在这里，我们报告了实验观察到，由于ZrO2纳米柱在(La2/3Sr1/3MnO3)1−x:(ZrO2)x (x = 0,0.2和0.3)纳米复合薄膜中引起的无序性的空间影响，电子行为从弱定位到增强弱定位的交叉。扫描透射电镜和高分辨率x射线衍射结果表明，随着ZrO2柱密度的增加，由于长度尺度的限制，空间应变区诱导了二维和三维局域化共存，并向典型的二维局域化转变，这与垂直界面应变的增强是一致的。基于我们的实验结果与局部化的单参数标度理论的良好一致性，在靠近不动点的金属范围内存在增强的弱局部化。这些薄膜为研究局域化提供了一个可调的实验模型，特别是通过适当选择第二外延相来研究过渡体制。图形抽象

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来源期刊

Nano Convergence Engineering-General Engineering

CiteScore

15.90

自引率

2.60%

发文量

审稿时长

13 weeks

期刊介绍： Nano Convergence is an internationally recognized, peer-reviewed, and interdisciplinary journal designed to foster effective communication among scientists spanning diverse research areas closely aligned with nanoscience and nanotechnology. Dedicated to encouraging the convergence of technologies across the nano- to microscopic scale, the journal aims to unveil novel scientific domains and cultivate fresh research prospects. Operating on a single-blind peer-review system, Nano Convergence ensures transparency in the review process, with reviewers cognizant of authors' names and affiliations while maintaining anonymity in the feedback provided to authors.