A smart power transistor for high voltage inverter applications

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 1993-01-01 DOI:10.1016/0026-2692(93)90101-J
{"title":"A smart power transistor for high voltage inverter applications","authors":"Rupprecht Gabriel","doi":"10.1016/0026-2692(93)90101-J","DOIUrl":null,"url":null,"abstract":"<div><p>Motors, lighting equipment and power supplied benefit from high voltage smart power integrated circuits. Limitations of standard isolation techniques in respect of reverse operation in inductive load applications, i.e. high <span><math><mtext>d</mtext><mtext>V/</mtext><mtext>d</mtext><mtext>t</mtext></math></span> load, cause standard isolation techniques to fail in these applications. Dielectric isolation techniques are overcoming these problems. This paper describes a new concept for high voltage power integrated circuits using silicon on insulator (SOI) technology in high voltage smart power transistors.</p><p>SOI technology enables the integration of vertical power transistors and smart power features such as gate drive, overcurrent and overtemperature shutdown circuitry. Using dielectric isolation techniques, virtually all power transistor families and integrated circuits technologies can be merged. The benefits and limitations of this technology are discussed in connection with a high voltage smart power MOS transistor and an IGBT using SOI technology.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"24 1","pages":"Pages 55-60"},"PeriodicalIF":1.9000,"publicationDate":"1993-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0026-2692(93)90101-J","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/002626929390101J","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1

Abstract

Motors, lighting equipment and power supplied benefit from high voltage smart power integrated circuits. Limitations of standard isolation techniques in respect of reverse operation in inductive load applications, i.e. high dV/dt load, cause standard isolation techniques to fail in these applications. Dielectric isolation techniques are overcoming these problems. This paper describes a new concept for high voltage power integrated circuits using silicon on insulator (SOI) technology in high voltage smart power transistors.

SOI technology enables the integration of vertical power transistors and smart power features such as gate drive, overcurrent and overtemperature shutdown circuitry. Using dielectric isolation techniques, virtually all power transistor families and integrated circuits technologies can be merged. The benefits and limitations of this technology are discussed in connection with a high voltage smart power MOS transistor and an IGBT using SOI technology.

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种用于高压逆变器应用的智能功率晶体管
电机,照明设备和电源供应受益于高压智能电源集成电路。在电感负载应用中,即高dV/dt负载的反向操作方面,标准隔离技术的局限性导致标准隔离技术在这些应用中失败。电介质隔离技术正在克服这些问题。本文介绍了在高压智能功率晶体管中采用绝缘体上硅(SOI)技术的高压功率集成电路的新概念。SOI技术可集成垂直功率晶体管和智能电源功能,如栅极驱动、过流和过温关断电路。使用介电隔离技术,几乎所有的功率晶体管家族和集成电路技术可以合并。结合高压智能功率MOS晶体管和采用SOI技术的IGBT,讨论了该技术的优点和局限性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
期刊最新文献
An investigation of how circuit parameters affect the short-circuit type 2 ruggedness in FS-IGBT A class-AB rail-to-rail operational amplifier with wide supply voltage and high gain Single-step electron beam evaporation for integrated dual-metal gate and gate field-plate in GaN-on-Si MIS-HEMTs Impact of the collector structure on the performance of the insulated gate bipolar transistor An 8-bit 1.16 mw 500 ms/s SAR ADC with bidirectional-bit-distribution-based offset calibration and partially activated accelerating current source
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1