Highly Reliable High-Brightness GaN-Based Flip Chip LEDs

S. Chang, W.S. Chen, S. Shei, T. Ko, C. Shen, Y. Hsu, C. Chang, J. Tsai, W. Lai, A.J. Lin
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引用次数: 17

Abstract

The properties of indium-tin-oxide (ITO)/Ni films as transparent ohmic contacts of nitride-based flip chip (FC) light emitting diodes (LEDs) were studied. It was found that 300degC rapid thermal annealed (RTA) ITO(15 nm)/Ni(1 nm) could provide good electrical and optical properties for FC LED applications. It was also found that 20-mA operation voltage and output power of the 465-nm FC LEDs with ITO/Ni/Ag reflective mirror were 3.16 V and 21 mW, respectively. Furthermore, it was found that output intensity of the proposed LED only decayed by 5% after 1200 h under 30-mA current injection at room temperature.
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高可靠的高亮度氮化镓基倒装芯片led
研究了铟锡氧化物(ITO)/Ni薄膜作为氮基倒装芯片(FC)发光二极管(led)透明欧姆触点的性能。发现300℃快速热退火(RTA) ITO(15 nm)/Ni(1 nm)可以为FC LED应用提供良好的电学和光学性能。采用ITO/Ni/Ag反射镜的465 nm FC led的20 ma工作电压和输出功率分别为3.16 V和21 mW。此外,在室温下,在30ma电流注入下,该LED的输出强度在1200 h后仅衰减5%。
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来源期刊
IEEE Transactions on Advanced Packaging
IEEE Transactions on Advanced Packaging 工程技术-材料科学:综合
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