Philipp A. Scharf, Johannes Iberle, H. Mantz, T. Walter, Christian Waldschrnidt
{"title":"Multiband Microwave Sensing for Surface Roughness Classification","authors":"Philipp A. Scharf, Johannes Iberle, H. Mantz, T. Walter, Christian Waldschrnidt","doi":"10.1109/MWSYM.2018.8439245","DOIUrl":null,"url":null,"abstract":"This contribution presents an approach for frequency dependent surface roughness classification algorithms. For both simulations and measurements of the backscattering on random rough surfaces statistically defined surfaces were synthesised as well as manufactured. The coexistence of quasi-identical real and model surface profiles enables the validation of scattering models. The Fresnel-Kirchhoff diffraction theory will be applied and compared with a full-wave simulation software as a reference followed by measurements in the E and D band. Frequency dependency and roughness scaling effects will be worked out to derive a model-based methodology for the estimation of roughness depths as it is needed for applications like road condition detection.","PeriodicalId":6675,"journal":{"name":"2018 IEEE/MTT-S International Microwave Symposium - IMS","volume":"181 ","pages":"934-937"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE/MTT-S International Microwave Symposium - IMS","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2018.8439245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This contribution presents an approach for frequency dependent surface roughness classification algorithms. For both simulations and measurements of the backscattering on random rough surfaces statistically defined surfaces were synthesised as well as manufactured. The coexistence of quasi-identical real and model surface profiles enables the validation of scattering models. The Fresnel-Kirchhoff diffraction theory will be applied and compared with a full-wave simulation software as a reference followed by measurements in the E and D band. Frequency dependency and roughness scaling effects will be worked out to derive a model-based methodology for the estimation of roughness depths as it is needed for applications like road condition detection.