A sub 1 V high PSRR CMOS bandgap voltage reference

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2011-09-01 DOI:10.1016/j.mejo.2011.06.010
Mohammad Chahardori, Mojtaba Atarodi, Mohammad Sharifkhani
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引用次数: 23

Abstract

A Bandgap circuit capable of generating a reference voltage of less than 1 V with high PSRR and low temperature sensitivity is proposed. High PSRR achieved by means of an improved current mode regulator which isolates the bandgap voltage from the variations and the noise of the power supply. A vigorous analytical approach is presented to provide a universal design guideline. The analysis unveils the sensitivity of the circuit characteristic to device parameters. The proposed circuit is fabricated in a 0.18μm CMOS technology and operates down to a supply voltage of 1.2 V. The circuit yields 20 ppm/°C of temperature coefficient in typical case and 50 ppm/°C of temperature coefficient in worst case over temperature range −40 to 140°C, 60 ppm/V of supply voltage dependence and 60 dB PSRR at 1 MHz without trimming or extra circuits for the curvature compensation. The entire circuit occupies 0.027 mm2 of die area and consumes 134μW from a 1.2 V supply voltage at room temperature. Twenty chips are tested to show the robustness of the topology and the measurement results are compared with Monte Carlo simulation and analysis.

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一个sub - 1v高PSRR CMOS带隙基准电压
提出了一种能产生小于1 V参考电压的带隙电路,具有高PSRR和低温度灵敏度。通过改进的电流模式调节器实现高PSRR,该调节器将带隙电压与电源的变化和噪声隔离开来。提出了一种强有力的分析方法,以提供通用的设计指南。分析揭示了电路特性对器件参数的敏感性。该电路采用0.18μm CMOS工艺,工作电压低至1.2 V。该电路在典型情况下的温度系数为20 ppm/°C,在- 40至140°C的温度范围内,在最坏情况下的温度系数为50 ppm/°C,电源电压依赖性为60 ppm/V,在1 MHz时的PSRR为60 dB,无需修整或额外的曲率补偿电路。整个电路的芯片面积为0.027 mm2,在室温下,电源电压为1.2 V,功耗为134μW。对20个芯片进行了测试,验证了拓扑的鲁棒性,并将测试结果与蒙特卡罗仿真和分析结果进行了比较。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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