Thermal aging reliability of socketable, surface-modified solder BGAs with and without polymer collars

Omkar Gupte, G. Murtagian, R. Tummala, V. Smet
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引用次数: 2

Abstract

Ball Grid Array (BGA) package designs are increasingly used in surface mount applications while Land Grid Array (LGA) designs are predominantly used in socketing. The need to converge to a single package design has been driving the need to enable socketable BGAs. BGA spheres with a noble metal surface provide a stable mechanical contact interface with the socket paddles. These noble contact interfaces, however, have to remain intact through the socketing life of the product, considering accelerated testing temperatures of 100-120 °C. Under such conditions, it has been reported that the solder from the ball-attach joints undergoes solid-state wicking along the surface of the ball, leading to complete Au dissolution and potential undesirable intermetallic formation with the socket paddles, along with a drop in ball shear strength due to depletion of the solder from the joints. This paper discusses the use of polymer collars to address this challenge and improve the thermal aging reliability of packages with surface-modified BGA interconnections. The polymer collars were spin-coated on the package, which was aged alongside a reference package with no collars, at accelerated test temperatures of 100 °C and 120 °C, respectively. XPS studies showed that after 650 h of aging, no Au signal but a strong Sn signal was observed in the package without collars, which confirmed complete solder wicking to the top of the ball, while the Au signal remained for the package with the collars, confirming that polymer collars are effective in inhibiting solid-state solder wicking from the ball-attach joints. The joints with polymer collars also showed mechanical stability throughout thermal aging with a 3X improvement in joint shear strength.
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带或不带聚合物环的嵌套式、表面改性焊料BGAs的热老化可靠性
球栅阵列(BGA)封装设计越来越多地用于表面贴装应用,而地栅阵列(LGA)封装设计主要用于插座。汇聚到单一包设计的需求推动了启用套接字bga的需求。具有贵金属表面的BGA球体与插座桨提供稳定的机械接触界面。然而,考虑到100-120°C的加速测试温度,这些高贵的接触界面必须在产品的插座寿命期间保持完整。在这种条件下,据报道,来自球连接接头的焊料沿着球的表面进行固态排芯,导致Au完全溶解,并与插座焊片形成潜在的不良金属间化合物,同时由于焊接接头的焊料耗尽而导致球剪切强度下降。本文讨论了使用聚合物环来解决这一挑战,并提高了表面改性BGA互连封装的热老化可靠性。在加速测试温度分别为100°C和120°C的条件下,聚合物环被旋转涂覆在封装上,与没有环的参考封装一起老化。XPS研究表明,在650 h的时效后,在没有环圈的封装中没有观察到Au信号,但有很强的Sn信号,这证实了焊锡完全吸进了球的顶部,而在有环圈的封装中仍然有Au信号,这证实了聚合物环圈有效地抑制了球连接接头的固态焊锡吸进。采用聚合物环的接头在热老化过程中也表现出机械稳定性,接头抗剪强度提高了3倍。
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