Emulation-based robustness assessment for automotive smart-power ICs

Manuel Harrant, T. Nirmaier, Jérôme Kirscher, C. Grimm, G. Pelz
{"title":"Emulation-based robustness assessment for automotive smart-power ICs","authors":"Manuel Harrant, T. Nirmaier, Jérôme Kirscher, C. Grimm, G. Pelz","doi":"10.7873/DATE.2014.017","DOIUrl":null,"url":null,"abstract":"In this paper we present a concept for assessing the robustness of automotive smart power ICs through lab measurements with respect to application variance and parameter spread. Classical compliance to the product specification, where only minimum and maximum values are defined, is not enough to assess device robustness since complex transients of application components cannot be defined within single specification parameters. That is why application fitness becomes a necessary task to reduce device failures, which may occur in the application. One solution would be to enhance traditional lab verification methods with a concept that considers application and parameter spread. This innovative concept is demonstrated on an electronic throttle control application. It has been emulated in real-time, including power amplification and application-relevant parameters. Monte Carlo experiments were carried out within the application space to evaluate the influence of parameter spread on selected system characteristics. Finally, an appropriate metric was used to quantify the robustness of the micro-electronic device within its application.","PeriodicalId":6550,"journal":{"name":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7873/DATE.2014.017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

In this paper we present a concept for assessing the robustness of automotive smart power ICs through lab measurements with respect to application variance and parameter spread. Classical compliance to the product specification, where only minimum and maximum values are defined, is not enough to assess device robustness since complex transients of application components cannot be defined within single specification parameters. That is why application fitness becomes a necessary task to reduce device failures, which may occur in the application. One solution would be to enhance traditional lab verification methods with a concept that considers application and parameter spread. This innovative concept is demonstrated on an electronic throttle control application. It has been emulated in real-time, including power amplification and application-relevant parameters. Monte Carlo experiments were carried out within the application space to evaluate the influence of parameter spread on selected system characteristics. Finally, an appropriate metric was used to quantify the robustness of the micro-electronic device within its application.
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基于仿真的汽车智能集成电路鲁棒性评估
在本文中,我们提出了一个概念,通过实验室测量应用方差和参数扩展来评估汽车智能电源ic的鲁棒性。对产品规范的经典遵从性,其中只定义了最小值和最大值,不足以评估设备的稳健性,因为应用组件的复杂瞬态不能在单个规格参数中定义。这就是为什么应用程序适应性成为减少应用程序中可能发生的设备故障的必要任务的原因。一种解决方案是通过考虑应用和参数传播的概念来增强传统的实验室验证方法。这一创新概念在电子节气门控制应用中得到了验证。并对其进行了实时仿真,包括功率放大和应用相关参数。在应用空间内进行蒙特卡罗实验,以评估参数扩散对选定系统特性的影响。最后,采用适当的度量来量化微电子器件在其应用中的鲁棒性。
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