R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov
{"title":"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers","authors":"R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov","doi":"10.1109/ISSCC42613.2021.9365991","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"3 1","pages":"541-542"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC42613.2021.9365991","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}