Exploit GaN FET technologies in high efficiency flyback topologies: pros and cons of different architectures

Fabio Cacciotto, A. Cannone
{"title":"Exploit GaN FET technologies in high efficiency flyback topologies: pros and cons of different architectures","authors":"Fabio Cacciotto, A. Cannone","doi":"10.23919/AEIT50178.2020.9241139","DOIUrl":null,"url":null,"abstract":"In this paper the potential of the GaN technology in the realization of high efficiency converters is dealt in detail, and different flyback topologies that exploit its characteristics are analyzed in terms of efficiency performance. Finally, pros and cons of each topology are discussed in detail.","PeriodicalId":6689,"journal":{"name":"2020 AEIT International Annual Conference (AEIT)","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 AEIT International Annual Conference (AEIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AEIT50178.2020.9241139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

In this paper the potential of the GaN technology in the realization of high efficiency converters is dealt in detail, and different flyback topologies that exploit its characteristics are analyzed in terms of efficiency performance. Finally, pros and cons of each topology are discussed in detail.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
在高效反激拓扑中开发GaN场效应管技术:不同架构的优缺点
本文详细讨论了氮化镓技术在实现高效变换器方面的潜力,并从效率性能方面分析了利用其特性的不同反激拓扑结构。最后,详细讨论了每种拓扑的优缺点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Spectral and Discriminant Analysis Based Classification of Faults in Induction Machines Overview of distribution grid test systems for benchmarking of power system analyses Exploit GaN FET technologies in high efficiency flyback topologies: pros and cons of different architectures Modeling the OHL vulnerability to strong wind New flexibility services and technologies: ENEL experiences in Italy
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1