D. Kajewski, J. Szade, J. Kubacki, K. Szot, A. Kohl, C. Lenser, R. Dittmann
{"title":"Fe valence determination in doped SrTiO3 epitaxial films","authors":"D. Kajewski, J. Szade, J. Kubacki, K. Szot, A. Kohl, C. Lenser, R. Dittmann","doi":"10.1109/ISAF.2012.6297843","DOIUrl":null,"url":null,"abstract":"Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"37 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ISAF-ECAPD-PFM 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2012.6297843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.
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