Hysteresis of In Situ CCVD Grown Graphene Transistors

P. Wessely, Frank Wessely, Emrah Birinci, Bernadette Riedinger, U. Schwalke
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引用次数: 13

Abstract

In this paper we report on a novel method to fabricate graphene transistors directly on oxidized silicon wafers without the need to transfer graphene. By means of catalytic chemical vapor deposition (CCVD) the in situ grown monolayer graphene field-effect transistors (MoLGFETs) and bilayer graphene field-effect transistors (BiLGFETs) are realized directly on oxidized silicon substrate. In situ CCVD grown BiLGFETs possess unipolar p-type device characteristics with an extremely high on/off-current ratio up to 1 × 10 7 . With this novel fabrication method hundreds of large scale in situ CCVD grown graphene FETs are realized simultaneously on one 2’’ wafer in a silicon CMOS compatible process.
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原位CCVD生长石墨烯晶体管的磁滞特性
本文报道了一种在氧化硅片上直接制备石墨烯晶体管而无需转移石墨烯的新方法。采用催化化学气相沉积(CCVD)的方法,在氧化硅衬底上直接制备了原位生长单层石墨烯场效应晶体管(molgfet)和双层石墨烯场效应晶体管(bilgfet)。原位CCVD生长的bilgfet具有单极p型器件特性,具有极高的通断电流比,最高可达1 × 10.7。利用这种新颖的制造方法,在硅CMOS兼容工艺中,在一块2英寸晶圆上同时实现了数百个大规模原位CCVD生长的石墨烯场效应管。
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来源期刊
Electrochemical and Solid State Letters
Electrochemical and Solid State Letters 工程技术-材料科学:综合
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