The effect of CdTe growth temperature and ZnTe:Cu contacting conditions on CdTe device performance

J. Burst, W. Rance, T. Barnes, M. Reese, J. Li, D. Kuciauskas, M. Steiner, T. Gessert, K. Zhang, C. T. Hamilton, K. Fuller, B. Aitken, C. K. Kosik Williams
{"title":"The effect of CdTe growth temperature and ZnTe:Cu contacting conditions on CdTe device performance","authors":"J. Burst, W. Rance, T. Barnes, M. Reese, J. Li, D. Kuciauskas, M. Steiner, T. Gessert, K. Zhang, C. T. Hamilton, K. Fuller, B. Aitken, C. K. Kosik Williams","doi":"10.1109/PVSC.2012.6317598","DOIUrl":null,"url":null,"abstract":"CdTe device performance is strongly dependent on the quality of the back contact and the ability of the back contact to introduce a copper doping profile in the CdTe layer itself. Copper-doped ZnTe (ZnTe:Cu) is a nearly ideal contact material for CdTe solar cells due to its work function and ability to source copper to CdTe. Most of the ZnTe:Cu studies in the past used CdTe grown at relatively low deposition temperatures (550°C and below). Here we investigate the use of ZnTe:Cu as a back contact for CdTe grown at temperatures up to 620°C. We observe a strong interplay between the CdTe absorber deposition conditions and optimized ZnTe:Cu contacting conditions. Device JV characteristics suggest that CdTe solar cells with absorber layers deposited by close-space sublimation (CSS) at high temperature, 600-620°C, are more robust to the back contact Cu doping level and contacting temperature than CdTe grown at lower temperatures. The implication for industrial processes is a ~1% absolute increase in device efficiency for devices in which the CdTe is deposited on PV glass at high temperature. Perhaps more importantly, this increased performance is maintained for a larger window of temperature and doping level of the ZnTe:Cu back contact. For devices with CdTe absorbers deposited at 600°C, device efficiency in excess of 13.5% is maintained for back contacts containing 2-5 wt.% Cu, and for contacting temperatures ranging from 300-360°C. Red-light bias quantum efficiency (QE) and capacitance-voltage (CV) measurements are used to probe the effect of the introduced copper doping profiles and net acceptor density to better understand how ZnTe:Cu sources influences the resulting CdTe device.","PeriodicalId":6318,"journal":{"name":"2012 38th IEEE Photovoltaic Specialists Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 38th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2012.6317598","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

CdTe device performance is strongly dependent on the quality of the back contact and the ability of the back contact to introduce a copper doping profile in the CdTe layer itself. Copper-doped ZnTe (ZnTe:Cu) is a nearly ideal contact material for CdTe solar cells due to its work function and ability to source copper to CdTe. Most of the ZnTe:Cu studies in the past used CdTe grown at relatively low deposition temperatures (550°C and below). Here we investigate the use of ZnTe:Cu as a back contact for CdTe grown at temperatures up to 620°C. We observe a strong interplay between the CdTe absorber deposition conditions and optimized ZnTe:Cu contacting conditions. Device JV characteristics suggest that CdTe solar cells with absorber layers deposited by close-space sublimation (CSS) at high temperature, 600-620°C, are more robust to the back contact Cu doping level and contacting temperature than CdTe grown at lower temperatures. The implication for industrial processes is a ~1% absolute increase in device efficiency for devices in which the CdTe is deposited on PV glass at high temperature. Perhaps more importantly, this increased performance is maintained for a larger window of temperature and doping level of the ZnTe:Cu back contact. For devices with CdTe absorbers deposited at 600°C, device efficiency in excess of 13.5% is maintained for back contacts containing 2-5 wt.% Cu, and for contacting temperatures ranging from 300-360°C. Red-light bias quantum efficiency (QE) and capacitance-voltage (CV) measurements are used to probe the effect of the introduced copper doping profiles and net acceptor density to better understand how ZnTe:Cu sources influences the resulting CdTe device.
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CdTe生长温度和ZnTe:Cu接触条件对CdTe器件性能的影响
CdTe器件的性能在很大程度上取决于背触点的质量以及背触点在CdTe层本身引入铜掺杂的能力。铜掺杂ZnTe (ZnTe:Cu)由于其功功能和将铜源转化为CdTe的能力,是一种近乎理想的CdTe太阳能电池接触材料。过去的大多数ZnTe:Cu研究都是在相对较低的沉积温度(550°C及以下)下生长的CdTe。在这里,我们研究了在高达620°C的温度下使用ZnTe:Cu作为CdTe生长的背触点。我们观察到CdTe吸收剂沉积条件和优化的ZnTe:Cu接触条件之间有很强的相互作用。器件JV特性表明,高温(600 ~ 620℃)近空间升华(CSS)沉积吸收层的CdTe太阳能电池对Cu掺杂水平和接触温度的鲁棒性优于低温生长的CdTe太阳能电池。对工业过程的影响是在高温下将CdTe沉积在PV玻璃上的器件的器件效率绝对提高约1%。也许更重要的是,这种提高的性能保持在更大的温度窗口和ZnTe:Cu背接触的掺杂水平。对于在600°C沉积CdTe吸收剂的设备,对于含有2-5 wt.% Cu的背触点,以及接触温度范围为300-360°C的设备,设备效率保持在13.5%以上。红光偏置量子效率(QE)和电容电压(CV)测量用于探测引入铜掺杂谱和净受体密度的影响,以更好地了解ZnTe:Cu源如何影响最终的CdTe器件。
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