{"title":"Conditional soft-edge flip-flop for SET mitigation","authors":"Panagiotis Sismanoglou, D. Nikolos","doi":"10.1109/IOLTS.2016.7604708","DOIUrl":null,"url":null,"abstract":"Single event transient (SET) pulses are a significant cause of soft errors in a circuit. To cope with SET pulses, we propose a new storage cell that is able to operate either as a hard-edge or soft-edge flip-flop depending on the appearance or not of a transition in a time window. The efficiency of the proposed design with respect to the reduction of soft-errors coming from SET pulses was shown with extensive simulations.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"29 1","pages":"227-232"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604708","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Single event transient (SET) pulses are a significant cause of soft errors in a circuit. To cope with SET pulses, we propose a new storage cell that is able to operate either as a hard-edge or soft-edge flip-flop depending on the appearance or not of a transition in a time window. The efficiency of the proposed design with respect to the reduction of soft-errors coming from SET pulses was shown with extensive simulations.
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