Life Prediction of Electromagnetic Relay Based on Bayesian Method

Jiang Wenman, Zhou Zhen, Qi Jia, Ma Dezhong
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引用次数: 5

Abstract

so far, there is a question about the existing study of electromagnetic relay’s life prediction: they mainly focused on the research of batch products as a whole, which cannot reflect individual differences. This paper proposes one kind of way about the life prediction of electromagnetic relay based on Bayesian method. Firstly, a prior distribution of the model parameters is determined on the basis of the determined degradation model. Then, the degradation data (contact resistance) based on the prior distribution is fused, and the parameters of the degenerate trajectory model are updated to obtain the reliability function. Finally, we can predict the lifetime of a single electromagnetic relay. The results show that the lifetime prediction of a single electromagnetic relay is realized by the Bayesian method, in which the No.10 electromagnetic relay predicts the life of the electromagnetic relay to be $1.28 \times 10^{5}$ times and the relative error is 0.06 for the test lifetime value is $1.21 \times 10^{5}$ times under the condition of a reliability of 90%. The feasibility of predicting the lifetime of a single electromagnetic relay using fusion degradation data is verified
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基于贝叶斯方法的电磁继电器寿命预测
到目前为止,现有的电磁继电器寿命预测研究存在一个问题:主要集中在对批量产品整体的研究上,不能反映个体差异。本文提出了一种基于贝叶斯方法的电磁继电器寿命预测方法。首先,在确定退化模型的基础上确定模型参数的先验分布;然后,对基于先验分布的退化数据(接触电阻)进行融合,更新退化轨迹模型参数,得到可靠性函数;最后,我们可以预测单个电磁继电器的寿命。结果表明,采用贝叶斯方法实现了单个电磁继电器的寿命预测,其中10号电磁继电器在可靠性为90%的情况下,对该电磁继电器的寿命预测值为$1.28 \ × 10^{5}$次,试验寿命值为$1.21 \ × 10^{5}$次,相对误差为0.06。验证了利用熔合退化数据预测单个电磁继电器寿命的可行性
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