Qianying Tang, W. Choi, L. Everson, K. Parhi, C. Kim
{"title":"A Physical Unclonable Function based on Capacitor Mismatch in a Charge-Redistribution SAR-ADC","authors":"Qianying Tang, W. Choi, L. Everson, K. Parhi, C. Kim","doi":"10.1109/ISCAS.2018.8351601","DOIUrl":null,"url":null,"abstract":"A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.","PeriodicalId":6569,"journal":{"name":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"2 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Circuits and Systems (ISCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2018.8351601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.