Высокая чувствительность пленок оксида индия, полученных методом хлоридной газофазной эпитаксии, к аммиаку

Д.А. Алмаев, А.В. Алмаев, В. И. Николаев, П.Н. Бутенко, М.П. Щеглов, А.В. Чикиряка, А.И. Печников
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Abstract

The effect of H2, NH3, CO and O2 on the electrically conductive properties of In2O3 films grown by halide vapor phase epitaxy has been studied. In the temperature range of 200−550°C, In2O3 films demonstrate gas sensitivity to all considered gases, a relatively high operation speed and repeatability of cycles. The greatest response to NH3 was obtained, which exceeded 33 arb.units at a temperature of 400°C and a gas concentration of 1000 ppm. A qualitative mechanism of gas sensitivity of In2O3 films is proposed. The obtained gas-sensitive characteristics are compared with known NH3 sensors based on various materials. It is shown that the method of halide vapor phase epitaxy makes it possible to obtain indium oxide films with high gas sensitivity
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印度氧化物的高灵敏度,由氯化气体冲击引起。
研究了H2、NH3、CO和O2对卤化物气相外延法制备In2O3薄膜导电性能的影响。在200 - 550°C的温度范围内,In2O3薄膜对所有考虑的气体都表现出气敏性,具有相对较高的运行速度和循环的可重复性。对NH3的反应最大,超过33 arb。温度为400°C,气体浓度为1000ppm。提出了in2o3薄膜气敏的定性机理。所获得的气敏特性与基于各种材料的已知NH3传感器进行了比较。结果表明,卤化物气相外延法可以制备出高气敏氧化铟薄膜
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