Study of Thermal Annealing on Morphology, Structure and Optical Properties Of CdSe Thin Films at Different Annealing Temperatures

Abstract

CdSe thin films were deposited on the glass substrate by chemical bath deposition and annealed at various temperatures (373, 573, 773, and 873 K). Scanning electron microscopy (SEM) was used to study the surface of hexagonal structure and the grains with different sizes increasing with annealing temperature. X-ray diffraction (XRD) spectra with a distinguish peak (002) for CdSe films with a hexagonal structure and annealed films were polycrystalline. The crystallinity was improved at 873 K. The bandgap for CdSe films was 2.2 eV, which decreased with increasing annealing temperature.