R. Sugathan, S. Ananda, Vinitha Ramdas, P. Satyanarayana, M. Sankaran, R. S. Ekkundi
{"title":"Worst case circuit analysis of a new balancing circuit for spacecraft application","authors":"R. Sugathan, S. Ananda, Vinitha Ramdas, P. Satyanarayana, M. Sankaran, R. S. Ekkundi","doi":"10.1109/ICPACE.2015.7274967","DOIUrl":null,"url":null,"abstract":"This paper describes an approach adopted for a worst case circuit analysis done on an autonomous, passive, fail proof balancing electronic circuit used for cell balancing of Lithium ion batteries for GEO (geosynchronous orbit) satellites. Under the worst case scenarios, of operating environmental conditions and device parameter drift, how the performance of the circuit varies is studied. It is carried out as a part of design as to demonstrate that the circuit performs within specification. This analysis considers variation in constituent device parameters and the imposed environment, during entire lifetime. The analysis provides sufficient operating margins for all operating conditions in the circuit.","PeriodicalId":6644,"journal":{"name":"2015 International Conference on Power and Advanced Control Engineering (ICPACE)","volume":"50 1","pages":"327-332"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Conference on Power and Advanced Control Engineering (ICPACE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPACE.2015.7274967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper describes an approach adopted for a worst case circuit analysis done on an autonomous, passive, fail proof balancing electronic circuit used for cell balancing of Lithium ion batteries for GEO (geosynchronous orbit) satellites. Under the worst case scenarios, of operating environmental conditions and device parameter drift, how the performance of the circuit varies is studied. It is carried out as a part of design as to demonstrate that the circuit performs within specification. This analysis considers variation in constituent device parameters and the imposed environment, during entire lifetime. The analysis provides sufficient operating margins for all operating conditions in the circuit.