Terahertz detection using Si-SiGe MODFETs

Y. Meziani, J. Velazquez-Perez, E. García-García, D. Coquillat, N. Dyakonova, W. Knap, I. Grigelionis, K. Fobelets
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Abstract

We report on resonant and non-resonant (broad-band) detection of terahertz (THz) radiation using Strained-Si MODFETs. The devices were excited at room temperature by two types of THz sources at 0.292 THz and at 1.5 THz. Non-resonant response with maxima around the threshold voltage was observed. Shubnikov-de Haas along with photoresponse measurements were performed simultaneously to demonstrate that the observed response is related to the plasma waves oscillation in the channel. The device was cooled down to 4.2 K and resonant signature could be observed.
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使用Si-SiGe modfet进行太赫兹探测
我们报道了利用应变si modfet对太赫兹(THz)辐射进行谐振和非谐振(宽带)探测。在室温下,用两种太赫兹源分别在0.292 THz和1.5 THz下激发器件。非谐振响应在阈值电压附近有最大值。同时进行了Shubnikov-de Haas和光响应测量,以证明观察到的响应与通道中的等离子体波振荡有关。将器件冷却至4.2 K,可以观察到谐振信号。
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