V. Molodkin, V. Storizhko, V. Kladko, V. Lizunov, A. I. Nizkova, A. Gudimenko, S. I. Olikhovskii, M. G. Tolmachev, S. V. Dmitriev, I. I. Demchyk, E.I. Bogdanov, B. I. Hinko
{"title":"Integrated dynamical phase-variation diffracto-metry of single crystals with defects of three and more types","authors":"V. Molodkin, V. Storizhko, V. Kladko, V. Lizunov, A. I. Nizkova, A. Gudimenko, S. I. Olikhovskii, M. G. Tolmachev, S. V. Dmitriev, I. I. Demchyk, E.I. Bogdanov, B. I. Hinko","doi":"10.15407/spqeo26.01.017","DOIUrl":null,"url":null,"abstract":"Generalization of the methods for the purposeful influence of the interrelated variations inherent to different experimental conditions on changes in the selectivity of the sensitivity of the azimuthal dependence of the total integrated intensity of dynamical diffraction to various types of defects in single crystals has been carried out. As a result, the improved phase-variation methods with additionally increased sensitivity and informativity of non-destructive structural diagnostics aimed at multi-parametrical single crystal systems have been developed.","PeriodicalId":21598,"journal":{"name":"Semiconductor physics, quantum electronics and optoelectronics","volume":"12 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Semiconductor physics, quantum electronics and optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15407/spqeo26.01.017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Generalization of the methods for the purposeful influence of the interrelated variations inherent to different experimental conditions on changes in the selectivity of the sensitivity of the azimuthal dependence of the total integrated intensity of dynamical diffraction to various types of defects in single crystals has been carried out. As a result, the improved phase-variation methods with additionally increased sensitivity and informativity of non-destructive structural diagnostics aimed at multi-parametrical single crystal systems have been developed.