Pulsed laser deposition (PLD) of ferroelectric thin films in conjunction with superconducting oxides

S. Sengupta, L. Sengupta, W. E. Kosik
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Abstract

The possibility of combining ferroelectrics and superconductors has been of interest for use in memory storage devices. Additionally, superconductors offer crystal structures compatible to the epitaxial growth of the ferroelectric, Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO), which is cubic at this stoichiometry. BSTO has a lattice constant of 3.94 /spl Aring/ as compared to the superconducting Pr/sub 2-x/Ce/sub x/CuO/sub 4/ tetragonal single crystal which also has a lattice constant of a=3.94 /spl Aring/. In this study, ferroelectric thin films of BSTO were deposited on single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/. The optical constants of the substrates, single crystals of Pr/sub 2/CuO/sub 4/ and Pr/sub 2-x/Ce/sub x/CuO/sub 4/, were determined using Variable Angle Spectroscopic Ellipsometry (VASE) and the composition and crystal structure were examined using Rutherford Backscattering Spectrometry (RBS) with ion beam channeling. The substrate/film interfaces and the compositional variation in the films were also studied with RBS and with SEM/EDS. Glancing angle X-ray diffraction was used to verify the epitaxial nature of the films. The effect of the deposition parameters (laser repetition rate, oxygen backfill pressure, and deposition geometry) on the quality of the films was experimented with and the optimized parameters were used.
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铁电薄膜与超导氧化物的脉冲激光沉积(PLD)
将铁电体和超导体结合在一起的可能性已引起人们对存储器存储装置的兴趣。此外,超导体提供了与铁电晶体Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO)外延生长相容的晶体结构,在这种化学统计下,它是立方的。与超导的Pr/sub - 2-x/Ce/sub -x/ CuO/sub - 4/四方单晶相比,BSTO的晶格常数为3.94 /spl Aring/。本研究在Pr/sub - 2/CuO/sub - 4/和Pr/sub - 2-x/Ce/sub -x/ CuO/sub - 4/单晶上沉积了BSTO铁电薄膜。利用变角椭圆偏振仪(VASE)测定了Pr/sub 2/CuO/sub 4/和Pr/sub 2-x/Ce/sub x/CuO/sub 4/单晶的光学常数,并利用离子束通道卢塞福后向散射光谱(RBS)检测了其组成和晶体结构。利用RBS和SEM/EDS研究了衬底/薄膜界面和薄膜成分的变化。用掠射角x射线衍射验证了薄膜的外延性质。实验了沉积参数(激光重复频率、氧充填压力和沉积几何形状)对薄膜质量的影响,并采用了优化后的参数。
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