M. Fendrich, C. Weiss, M. Lange, T. Kunstmann, R. Möller, Kai Ruschmeyer, A. Schirmeisen, W. Kamiński, R. Pérez
{"title":"Imaging Beyond Topography","authors":"M. Fendrich, C. Weiss, M. Lange, T. Kunstmann, R. Möller, Kai Ruschmeyer, A. Schirmeisen, W. Kamiński, R. Pérez","doi":"10.1002/IMIC.200890038","DOIUrl":null,"url":null,"abstract":"As a relatively new scanning probe technique, Dynamic Force Microscopy [1] has proved to be a powerful tool, allowing for imaging the topography of a sample surface with true atomic resolution. Besides topographic imaging, the simultaneously recorded damping signal is related to non-conservative interaction between tip and sample. For a molecular system, we show the tip-induced switching of the functionalized groups of the organic molecule leading to an enhanced damping signal.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"200 1","pages":"25-28"},"PeriodicalIF":0.0000,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/IMIC.200890038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
As a relatively new scanning probe technique, Dynamic Force Microscopy [1] has proved to be a powerful tool, allowing for imaging the topography of a sample surface with true atomic resolution. Besides topographic imaging, the simultaneously recorded damping signal is related to non-conservative interaction between tip and sample. For a molecular system, we show the tip-induced switching of the functionalized groups of the organic molecule leading to an enhanced damping signal.
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