{"title":"Scanning Ion Conductance Microscopy","authors":"J. Rheinlaender, T. Schäffer","doi":"10.1007/3-540-27453-7_3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"48 1","pages":"433-460"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/3-540-27453-7_3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
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