Research and Application of Double-sided Thermal Resistance Test Method for Press-pack IGBT

Yihui Zhang, Pengfei Wu, M. Cui, Zhongyuan Chen, Yinghan Liu, Jinyuan Li
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Abstract

With the acceleration of energy transformation and the development of power grid equipment technology, the capacity and voltage level of flexible DC transmission project are gradually improved. There is an urgent need for the support of power semiconductor IGBT with higher voltage level and larger capacity. As the press-pack IGBT has two heat dissipation surfaces, and the heat dissipation power of each heat dissipation surface is determined by the proportion of double-sided thermal resistance, the existing test methods cannot determine the heat dissipation power of both sides before obtaining the thermal resistance value. Firstly, this paper summarizes the existing welding and press-pack thermal resistance test methods, analyzes the composition of press-pack IGBT double-sided thermal resistance, puts forward the thermal resistance test method based on the equivalent measurement of press-pack IGBT double-sided heat flux, realizes the synchronous measurement of asymmetric press-pack IGBT double-sided thermal resistance, and studies the influence law of pressure on IGBT thermal resistance characteristics based on the test platform.
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压包式IGBT双面热阻测试方法的研究与应用
随着能源转型的加快和电网设备技术的发展,柔性直流输电工程的容量和电压水平逐步提高。目前迫切需要更高电压级、更大容量的功率半导体IGBT的支持。由于压包式IGBT有两个散热面,每个散热面的散热功率由双面热阻的比例决定,现有的测试方法无法在得到热阻值之前确定两面的散热功率。本文首先总结了现有的焊接和压包热阻测试方法,分析了压包IGBT双面热阻的组成,提出了基于压包IGBT双面热流通量等效测量的热阻测试方法,实现了不对称压包IGBT双面热阻的同步测量;并基于测试平台研究了压力对IGBT热阻特性的影响规律。
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