T. Kono, T. Ito, T. Tsuruda, Takayuki Nishiyama, Tsutomu Nagasawa, Tomoya Ogawa, Y. Kawashima, H. Hidaka, T. Yamauchi
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引用次数: 41
Abstract
This paper presents 40nm eFlash macros for automotive. There are three key features; 1) a 40nm SG-MONOS cell scaled to the next generation of [1]; 2) a fast random-read-access (over 160MHz) and the developed sense amplifier (SA); and, 3) circuit techniques for reliable and fast P/E operations even at the junction temperature (Tj) of 170°C.
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