An soft error propagation analysis considering logical masking effect on re-convergent path

Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto
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引用次数: 1

Abstract

This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.
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考虑再收敛路径上逻辑掩蔽效应的软误差传播分析
本文提出了一种精确的软误差传播分析技术。我们特别关注触发器中的单事件干扰(SEU)。该方法考虑了再收敛路径上的逻辑掩蔽,能够有效地计算出精确的误差传播概率。实验结果表明,该方法与仅使用SAT求解器的方法相比,计算时间提高了94.6%;与传统方法相比,计算精度提高了93.3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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