Should Logic SER be Solved at the Circuit Level?

T. M. Mak, S. Mitra
{"title":"Should Logic SER be Solved at the Circuit Level?","authors":"T. M. Mak, S. Mitra","doi":"10.1109/IOLTS.2006.56","DOIUrl":null,"url":null,"abstract":"SER is one of the problems associated with continued scaling. Traditionally, logic SER is solved at the system/architecture level (e.g., DMR, TMR, checkpointing/recovery). There has also been some work at the process level (e.g., SOI), but recently, there is also some research work on circuit level (e.g., cell hardening, BISER), but there has not been a wide spread adoption yet. Can logic SER be solved at the circuit level? Should they be? We have a team of experts from system, architecture and circuit area to debate this topic.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"41 1","pages":"199"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2006.56","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

SER is one of the problems associated with continued scaling. Traditionally, logic SER is solved at the system/architecture level (e.g., DMR, TMR, checkpointing/recovery). There has also been some work at the process level (e.g., SOI), but recently, there is also some research work on circuit level (e.g., cell hardening, BISER), but there has not been a wide spread adoption yet. Can logic SER be solved at the circuit level? Should they be? We have a team of experts from system, architecture and circuit area to debate this topic.
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逻辑SER应该在电路级解决吗?
SER是与持续扩展相关的问题之一。传统上,逻辑SER是在系统/体系结构级别解决的(例如,DMR、TMR、检查点/恢复)。在工艺层面也有一些工作(如SOI),但最近在电路层面也有一些研究工作(如细胞硬化、BISER),但还没有被广泛采用。逻辑SER可以在电路级解决吗?应该吗?我们邀请了来自系统、架构和电路领域的专家来讨论这个话题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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