E. Yamazaki, S. Wakana, M. Kishi, M. Iwanami, S. Hoshino, A. Tsuchiya
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引用次数: 6
Abstract
We report on the first fine x-z mapping experiment of magnetic near-field distribution over fine circuit patterns. Required three-dimensional (3D) spatial resolution was brought about by utilizing the fiber-edged magneto-optic (FEMO) probe structure. The 3D mapping technique of electromagnetic fields provides more information about finer variations in the vertical (z) direction in cases of finer circuits. The electro-optic/magneto-optic (EO/MO) probing techniques are promising toward this purpose since one can take its attractive natures such as wide-bandwidth, high-sensitivity, low invasiveness, and relatively high-spatial-resolution.
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