Hybrid package for high performance Inertial Measurement Units

M. Del, A. Gritti, Douglas Lodgson, D. Cheng, N. Manca, R. Duca, T. Lao, Yiyi Ma
{"title":"Hybrid package for high performance Inertial Measurement Units","authors":"M. Del, A. Gritti, Douglas Lodgson, D. Cheng, N. Manca, R. Duca, T. Lao, Yiyi Ma","doi":"10.1109/ectc32862.2020.00075","DOIUrl":null,"url":null,"abstract":"In the field of MEMS sensors, package plays a primary role since it strongly affects device behavior and performance. Depending on the application and mission profile, design and package technology need to be targeted in order to fit the best the given requirements.When sensors work in harsh environments like in automotive applications, system is subject to very aggressive thermal cycles. Neglecting cost aspects, main and conflicting features are electrical performance stability and package board level reliability.Due to the high mechanical stiffness and due to the coefficient of thermal expansion matched versus that of silicon, ceramic cavity packages limit the stress transfer to the MEMS sensor ensuring high performance in terms of stability. However, the substantial mechanical proprieties discrepancy compared to that of PCB, implies stress absorption at solder joint level causing reduced board level reliability performance. Cavity packages based on organic substrate, show opposite behavior. If on the one hand they shift the stress concentration toward the substrate increasing board level reliability, on the other they worsen package-to-MEMS decoupling and thus the stability performance.In this paper a hybrid package is presented to achieve optimal trade-off between stability and reliability requirements. Proposed solution is based on a Si-interposer glue-bonded on the substrate, ASIC and MEMS dice are attached on top of it. Si-interposer provides stiff substrate with low coefficient of thermal expansion ensuring package-to-MEMS decoupling. Organic substrate shifts stress concentration to the interposer DA material increasing board level reliability performance.Numerical analysis has been performed to properly design the package. Focus is given to solder joint reliability at the thermal cycles. Experimental solder joint reliability test and electrical performance characterization are finally presented to confirm the effectiveness of the proposed approach.","PeriodicalId":6722,"journal":{"name":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","volume":"36 1","pages":"425-431"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc32862.2020.00075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In the field of MEMS sensors, package plays a primary role since it strongly affects device behavior and performance. Depending on the application and mission profile, design and package technology need to be targeted in order to fit the best the given requirements.When sensors work in harsh environments like in automotive applications, system is subject to very aggressive thermal cycles. Neglecting cost aspects, main and conflicting features are electrical performance stability and package board level reliability.Due to the high mechanical stiffness and due to the coefficient of thermal expansion matched versus that of silicon, ceramic cavity packages limit the stress transfer to the MEMS sensor ensuring high performance in terms of stability. However, the substantial mechanical proprieties discrepancy compared to that of PCB, implies stress absorption at solder joint level causing reduced board level reliability performance. Cavity packages based on organic substrate, show opposite behavior. If on the one hand they shift the stress concentration toward the substrate increasing board level reliability, on the other they worsen package-to-MEMS decoupling and thus the stability performance.In this paper a hybrid package is presented to achieve optimal trade-off between stability and reliability requirements. Proposed solution is based on a Si-interposer glue-bonded on the substrate, ASIC and MEMS dice are attached on top of it. Si-interposer provides stiff substrate with low coefficient of thermal expansion ensuring package-to-MEMS decoupling. Organic substrate shifts stress concentration to the interposer DA material increasing board level reliability performance.Numerical analysis has been performed to properly design the package. Focus is given to solder joint reliability at the thermal cycles. Experimental solder joint reliability test and electrical performance characterization are finally presented to confirm the effectiveness of the proposed approach.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于高性能惯性测量单元的混合封装
在MEMS传感器领域,封装起着重要的作用,因为它强烈地影响器件的行为和性能。根据应用和任务概况,需要有针对性地设计和封装技术,以便最好地满足给定的要求。当传感器在恶劣的环境中工作时,如汽车应用,系统会受到非常剧烈的热循环。忽略成本方面,主要和冲突的特征是电气性能稳定性和封装板级可靠性。由于高机械刚度和与硅相匹配的热膨胀系数,陶瓷腔封装限制了向MEMS传感器的应力传递,确保了稳定性方面的高性能。然而,与PCB相比,实质性的机械性能差异意味着焊点水平的应力吸收导致板级可靠性性能降低。基于有机衬底的空腔封装则表现出相反的行为。如果一方面它们将应力集中转移到基板上,从而提高板级可靠性,另一方面它们会恶化封装与mems的去耦,从而降低稳定性性能。本文提出了一种混合方案,以达到稳定性和可靠性之间的最佳平衡。提出的解决方案是在衬底上粘接硅中间层,在其上附着ASIC和MEMS芯片。Si-interposer提供具有低热膨胀系数的刚性衬底,确保封装与mems的去耦。有机衬底将应力集中转移到中间材料上,提高了板级可靠性性能。为了合理设计该封装,进行了数值分析。重点讨论了焊点在热循环下的可靠性。最后进行了焊点可靠性试验和电性能表征,验证了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Thermal aging reliability of socketable, surface-modified solder BGAs with and without polymer collars Plating-free Bumping by Cu Nanopaste and Injection Molded Solder (IMS) for Fine Pitch Flip Chip Joining Photosensitive polymer reliability for fine pitch RDL applications Characterization and Application of a Novel Permanent Bonding Material ECTC 2020 Breaker Page
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1