{"title":"Simulation and analysis for typical package assembly manufacture","authors":"Y. Liu, S. Irving, D. Desbiens, T. Luk","doi":"10.1109/ESIME.2006.1643949","DOIUrl":null,"url":null,"abstract":"The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap.","PeriodicalId":60796,"journal":{"name":"微纳电子与智能制造","volume":"33 1","pages":"1-10"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"微纳电子与智能制造","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ESIME.2006.1643949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap.