A 61-dB SNDR 700 µm2 second-order all-digital TDC with low-jitter frequency shift oscillators and dynamic flipflops

T. Konishi, Keisuke Okuno, S. Izumi, M. Yoshimoto, H. Kawaguchi
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引用次数: 19

Abstract

We present a small-area second-order all-digital time-to-digital converter (TDC) with two frequency shift oscillators (FSOs) comprising inverter chains and dynamic flipflops featuring low jitter. The proposed FSOs can maintain their phase states through continuous oscillation, unlike conventional gated ring oscillators (GROs) that are affected by transistor leakage. Our proposed FSOTDC is more robust and is eligible for all-digital TDC architectures in recent leaky processes. Low-jitter dynamic flipflops are adopted as a quantization noise propagator (QNP). A frequency mismatch occurring between the two FSOs can be canceled out using a least mean squares (LMS) filter so that second-order noise shaping is possible. In a standard 65-nm CMOS process, an SNDR of 61 dB is achievable at an input bandwidth of 500 kHz and a sampling rate of 16 MHz, where the respective area and power are 700 μm2 and 281 μW.
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一个61 db SNDR 700µm2二阶全数字TDC,具有低抖动频移振荡器和动态触发器
我们提出了一种小面积二阶全数字时间-数字转换器(TDC),它具有两个移频振荡器(fso),由逆变器链和具有低抖动的动态触发器组成。与受晶体管漏损影响的传统门控环振荡器(GROs)不同,所提出的fso可以通过连续振荡保持其相态。我们提出的FSOTDC更具鲁棒性,适用于最近泄漏过程中的全数字TDC架构。采用低抖动动态触发器作为量化噪声传播器(QNP)。两个fso之间发生的频率不匹配可以使用最小均方(LMS)滤波器消除,从而可以进行二阶噪声整形。在标准的65纳米CMOS工艺中,在输入带宽为500 kHz,采样率为16 MHz,面积和功率分别为700 μm2和281 μW时,SNDR可达到61 dB。
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