{"title":"Convergence of Microscopy techniques: An application to dislocation pit characteristics","authors":"A. Mouti","doi":"10.1002/IMIC.200990042","DOIUrl":null,"url":null,"abstract":"Keywords: AlInN,GaN, SEM, TEM, Weak Beam, LACBED Note: Invited paper Reference CIME-ARTICLE-2009-021doi:10.1002/imic.200990042 Record created on 2009-11-09, modified on 2017-05-12","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"30 1","pages":"50-52"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/IMIC.200990042","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Keywords: AlInN,GaN, SEM, TEM, Weak Beam, LACBED Note: Invited paper Reference CIME-ARTICLE-2009-021doi:10.1002/imic.200990042 Record created on 2009-11-09, modified on 2017-05-12
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
