{"title":"Influence of trace water and oxygen on characteristic decomposed components of SF6 under partial discharge","authors":"Zeng Fuping, Tang Ju, Z. Xiaoxing","doi":"10.1109/ICHVE.2012.6357037","DOIUrl":null,"url":null,"abstract":"Monitoring the contents of decomposed components of SF<sub>6</sub> in order to identify the internal insulation faults of electrical equipment with SF<sub>6</sub> dielectric is a common practice. Partial discharges (PDs) can lead to the decomposition of the SF<sub>6</sub> dielectric. The new reactions also cause the final decomposed components to differ due to the different concentrations of H<sub>2</sub>O and O<sub>2</sub> even under the same strength of PD. Thus, the accuracy of assessing inner insulation faults is affected when using the concentration and corresponding change of decomposed components. In this work, two main characteristic components SO<sub>2</sub>F<sub>2</sub> and SOF<sub>2</sub> was researched. The purpose is to perform influence analysis of trace H<sub>2</sub>O and O<sub>2</sub> on the characteristic components. Research findings indicated that the amount of SOF<sub>2</sub> strongly correlates to the amount of trace H<sub>2</sub>O, whereas the amount of SO<sub>2</sub>F<sub>2</sub> is weakly related to trace H<sub>2</sub>O. Furthermore, the dilution effect of trace O<sub>2</sub> on SOF<sub>2</sub> obviously exceeds that on SO<sub>2</sub>F<sub>2</sub>.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"42 1","pages":"505-508"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on High Voltage Engineering and Application","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHVE.2012.6357037","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Monitoring the contents of decomposed components of SF6 in order to identify the internal insulation faults of electrical equipment with SF6 dielectric is a common practice. Partial discharges (PDs) can lead to the decomposition of the SF6 dielectric. The new reactions also cause the final decomposed components to differ due to the different concentrations of H2O and O2 even under the same strength of PD. Thus, the accuracy of assessing inner insulation faults is affected when using the concentration and corresponding change of decomposed components. In this work, two main characteristic components SO2F2 and SOF2 was researched. The purpose is to perform influence analysis of trace H2O and O2 on the characteristic components. Research findings indicated that the amount of SOF2 strongly correlates to the amount of trace H2O, whereas the amount of SO2F2 is weakly related to trace H2O. Furthermore, the dilution effect of trace O2 on SOF2 obviously exceeds that on SO2F2.