{"title":"Guarding trace and ground via-hole analysis for DDR interface designed in high-speed packages","authors":"R. Sung, K. Chiang, J. Lai, Yu-Po Wang","doi":"10.1109/IMPACT.2009.5382159","DOIUrl":null,"url":null,"abstract":"Because of the miniaturization on the demand, the area for the layout design is decreasing. But, more and more functions are integrated. In this situation, high-speed design, for example, the DDR access interface is easy to cause Simultaneous Switching Noises (SSN). In this paper, some analysis on this design was evaluated.","PeriodicalId":6410,"journal":{"name":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","volume":"14 1","pages":"136-139"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2009.5382159","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Because of the miniaturization on the demand, the area for the layout design is decreasing. But, more and more functions are integrated. In this situation, high-speed design, for example, the DDR access interface is easy to cause Simultaneous Switching Noises (SSN). In this paper, some analysis on this design was evaluated.
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