P. L’vov, S. V. Bulyarskiy, A. Saurov, V. Svetukhin, A. I. Terentyev
{"title":"Electron beam deposition of cobalt on the silicon substrate: Experiment and simulation","authors":"P. L’vov, S. V. Bulyarskiy, A. Saurov, V. Svetukhin, A. I. Terentyev","doi":"10.1116/6.0001223","DOIUrl":null,"url":null,"abstract":"We explore the electron beam deposition of cobalt on a silicon substrate. The deposition has been studied in experiments at different electron beam powers. The temperature distribution over the metal surface has been calculated using the stationary heat conduction equation for a two-phase system. The obtained calculation results on the dependence of the film growth rate on electron beam power are in good agreement with our experimental data. We have shown that the film growth rate is limited by the flux of cobalt atoms on the film surface.","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"193 1","pages":""},"PeriodicalIF":1.4000,"publicationDate":"2021-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Vacuum Science & Technology B","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/6.0001223","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We explore the electron beam deposition of cobalt on a silicon substrate. The deposition has been studied in experiments at different electron beam powers. The temperature distribution over the metal surface has been calculated using the stationary heat conduction equation for a two-phase system. The obtained calculation results on the dependence of the film growth rate on electron beam power are in good agreement with our experimental data. We have shown that the film growth rate is limited by the flux of cobalt atoms on the film surface.
期刊介绍:
Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.