A. Ayari, P. Vincent, S. Perisanu, P. Poncharal, S. Purcell
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引用次数: 9
Abstract
Field emission data are often represented on a Fowler-Nordheim plot, but a new empirical equation has been recently proposed to better analyse experiments. Such an equation is based on approximations of the Murphy and Good model and predicts that a constant parameter κ , depending only on the work function of the emitter, can be extracted from the data. We compared this empirical equation with simulations of the Murphy and Good model in order to determine the range of validity of the approximations and the robustness of the relationship between κ and the work function. We found that κ is constant only over a limited range of electric fields and so depends significantly on the field enhancement factor. This result calls into question the usefulness of the new empirical equation.
期刊介绍:
Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.