Young Wook Lee, Sun‐Jae Kim, Soo‐Yeon Lee, Woo-Geun Lee, Kap‐soo Yoon, Jaewoo Park, M. Han
{"title":"An Investigation of the Different Charge Trapping Mechanisms for SiNx and SiO2 Gate Insulator in a-IGZO TFTs","authors":"Young Wook Lee, Sun‐Jae Kim, Soo‐Yeon Lee, Woo-Geun Lee, Kap‐soo Yoon, Jaewoo Park, M. Han","doi":"10.1149/2.003204ESL","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"33 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrochemical and Solid State Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1149/2.003204ESL","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}