Pang-Shiu Chen, Yu-Sheng Chen, Heng-Yuan Lee, T. Wu, P. Gu, Frederick T. Chen, M. Tsai
{"title":"Impact of Flattened TiN Electrode on the Memory Performance of HfO2 Based Resistive Memory","authors":"Pang-Shiu Chen, Yu-Sheng Chen, Heng-Yuan Lee, T. Wu, P. Gu, Frederick T. Chen, M. Tsai","doi":"10.1149/2.001205ESL","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrochemical and Solid State Letters","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1149/2.001205ESL","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}